The substantial durability enhancement and failure mechanism of ultra-thin silver transparent electrodes under surge current

In various optoelectrical devices, the ability of electrodes to withstand surge currents has a significant impact on the lifespan of the device. Especially when considering the use of ultra-thin metal-based flexible electrodes, which have garnered interest in recent years, it is crucial to address the challenges related to the failure and stability of the silver layer under current conditions within the operating environment. Despite their pivotal importance, these issues often receive inadequate attention in practical applications. In this paper, we report a universal method for the growth of ultra-thin Ag metal films with different metal oxide dispersions (CdO, ZnO and SnO₂), emphasizing the evaluation of their stability under surge current. The findings indicated that the introduction of metal oxides significantly enhanced the growth conditions and surge stability of the ultra-thin Ag film. Among them, the Ag-CdO thin film exhibits an impressive average current withstand time of over 1000 min when subjected to a pulse current density of 0.83 MA cm⁻². The reasons behind the failure of ultra-thin Ag films under surge current conditions were also examined. These insights provide a robust foundation for realizing the full potential of ultra-thin metal-based flexible electrodes in microelectronic devices.