Abstract <p>This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO<sub>2</sub> thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO<sub>2</sub>) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO<sub>2</sub> thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies.</p> Graphical abstract <p></p>

错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Controlled wrinkling of TiO2 thin films for nanostructure-induced antireflective surfaces

  • Patryk Szymczak,
  • Piotr Jeleń,
  • Magdalena Ziąbka,
  • Marek Nocuń,
  • Bartosz Handke

摘要

Abstract

This work reports a novel strategy for achieving antireflective properties through the fabrication of nanostructured TiO2 thin films by controlled wrinkling under ultra-high vacuum (UHV) conditions. The approach is based on a designed bilayer system consisting of a titanium dioxide (TiO2) coating deposited on a dodecaphenyl-POSS scaffold, which generates a well-defined wrinkled nanostructure with enhanced light-scattering capability. Structural characterization by Grazing Incidence X-ray Diffraction (GIXRD) and Raman spectroscopy confirmed the coexistence of anatase and rutile phases, as well as a clear phase transformation influenced by annealing temperature. Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) analyses further elucidated the evolution of surface morphology, revealing a systematic decrease in wrinkle density and amplitude with increasing annealing temperature and TiO2 thickness. Optical measurements demonstrated a significant reduction in reflectance, with over 58% improvement compared to bare silicon substrates. These results highlight the potential of nanostructure-induced surface modification to improve optical performance and provide a promising pathway for applications in solar energy conversion, photonic coatings, and other energy-related technologies.

Graphical abstract