Influence of precursor powder characteristics on the microstructure and microwave dielectric properties of vat-photopolymerized Zn2SiO4–TiO2 ceramics
摘要
The additive manufacturing of complex Zn2SiO4–TiO2 (ZST) microwave dielectric ceramics via vat photopolymerization (VPP) presents challenges in balancing densification with phase purity. This study systematically investigates how the initial SiO2 precursor particle size (30 nm, 300 nm, and 5 μm) governs the entire process–property relationship. While the use of nano-sized SiO2 particles promoted sintering activity and improved densification, it also led to the emergence of a secondary phase with high dielectric loss, which adversely affected the quality factor (Q × f). Conversely, larger (micron-sized) particles suppress this impurity, ensuring high phase purity at the cost of slightly lower density. By leveraging this understanding, the ZST ceramic derived from 5 μm SiO2 (ZST3) achieved a favorable balance of properties, exhibiting a high quality factor (Q × f), a suitable dielectric constant (εr), and excellent thermal stability with a near-zero τf value. This study demonstrates that controlling the precursor particle size is an effective method for tailoring the microstructure and phase composition, thereby enhancing the performance of additively manufactured microwave dielectrics.