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<p>The instability of perovskite materials hampers their commercialization, and encapsulation has emerged as a promising strategy to address this issue. This work presents a full encapsulation strategy utilizing multilayer barriers, aligning with the ongoing efforts to extend the lifespan of perovskite devices. The full encapsulation provides exceptional protection by addressing common leakage pathways in conventional methods: lateral diffusion from the edges of active layers, leakage along electrode wires, and outgassing from the sealant. Furthermore, the design incorporates a multilayer barrier, consisting of polyvinylpyrrolidone (PVP), Al<sub>2</sub>O<sub>3</sub>, and MoO<sub>3</sub> layers, to specifically mitigate the detrimental effects of moisture, oxygen, and light-induced degradation, respectively. This comprehensive approach reduces the water vapor transmission rate to 25% of the original value and allows the samples to maintain 99.7% of their initial photoresponsivity during a 1&#xa0;h underwater test. When subjected to 60% relative humidity, encapsulated devices which typically degrade rapidly in their bare form retain 97.3% of their performance after 168&#xa0;h. Moreover, they retain up to 98% of their initial performance even after a large angle bending test. The results demonstrate the great potential of this strategy for widespread application in various fields, including underwater monitors, wearable devices, and optoelectronic systems such as perovskite solar cells (PSCs) and organic light-emitting diodes (OLEDs).</p> Graphical abstract <p></p>

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Robust full encapsulation for flexible perovskite devices under combined stress of humidity, oxygen, and UV

  • 期刊论文

  • 发表日期：

    2025年12月16日

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  • Chaojie Wu,
  • Yixiao Li,
  • Jiamin Chen,
  • Xujie Shi,
  • Feiyu Zhao,
  • Weiping Li

摘要

The instability of perovskite materials hampers their commercialization, and encapsulation has emerged as a promising strategy to address this issue. This work presents a full encapsulation strategy utilizing multilayer barriers, aligning with the ongoing efforts to extend the lifespan of perovskite devices. The full encapsulation provides exceptional protection by addressing common leakage pathways in conventional methods: lateral diffusion from the edges of active layers, leakage along electrode wires, and outgassing from the sealant. Furthermore, the design incorporates a multilayer barrier, consisting of polyvinylpyrrolidone (PVP), Al2O3, and MoO3 layers, to specifically mitigate the detrimental effects of moisture, oxygen, and light-induced degradation, respectively. This comprehensive approach reduces the water vapor transmission rate to 25% of the original value and allows the samples to maintain 99.7% of their initial photoresponsivity during a 1 h underwater test. When subjected to 60% relative humidity, encapsulated devices which typically degrade rapidly in their bare form retain 97.3% of their performance after 168 h. Moreover, they retain up to 98% of their initial performance even after a large angle bending test. The results demonstrate the great potential of this strategy for widespread application in various fields, including underwater monitors, wearable devices, and optoelectronic systems such as perovskite solar cells (PSCs) and organic light-emitting diodes (OLEDs).

Graphical abstract