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Temperature stability and low dielectric loss of (1-x)Ba0.4Sr0.6TiO3-xBi(Mg2/3Nb1/3)O3 ceramics for X9R capacitor applications

  • Haonan Wu,
  • Pengrong Ren,
  • Shu Yang,
  • Xiangcheng Qi,
  • Xin Wang

摘要

Based on the popularity of intelligent series products, electric vehicles, and portable PCs, the market demand for multi-layer ceramic capacitors (MLCC) has increased extensively. The development of MLCC tends to be of high capacity and small size. Therefore, it is urgent to develop dielectric materials with a wide temperature range and low loss, which is conducive to the operational stability of devices. In this work, (1-x)Ba0.4Sr0.6TiO3-xBi(Mg2/3Nb1/3)O3 (x = 0.20–0.25) ceramics were prepared using a solid-state reaction method. Introducing Bi(Mg2/3Nb1/3)O3 restrains the oxygen loss, reduces the grain size of the sample, breaks the long-range ordered structure, forms polar nanomicroregions, and improves the temperature stability of dielectric materials. Specifically, the sample with x = 0.25 exhibits good dielectric properties (εr = 614, tanδ = 0.0003, at 25 °C and 1 kHz) and high DC resistivity (5.52 × 108 Ω cm) at 300 °C. The dielectric properties of (1-x)BST-xBMN ceramics exhibit good temperature stability in a wide temperature range (− 55 to 200 °C), which meets the requirements of X9R capacitors.

Graphical Abstract