LEIS-net: lightweight and efficient industrial surface defect detection network
摘要
Surface defect detection is crucial for ensuring industrial product quality. However, considering the intricate texture structures and noise of these products, existing object detection networks have struggled to achieve both accurate and rapid detection while maintaining low complexity. This paper proposed LEIS-Net, a lightweight and efficient industrial surface defect detection network. First, to reduce backbone network complexity while optimizing downsampling and feature extraction, an edge information extraction module (EIEM) was designed for the front end of the network. Additionally, a multi-scale downsampling (MSD) module based on Haar wavelets, and a lightweight feature enhancement module (LFEM) were integrated into the middle of the network. Second, to improve neck’s efficiency in fusing multi-scale features, channel alignment and the bi-directional feature pyramid network (BiFPN) fusion were adopted in the network. Finally, to enhance efficiency and generalization, the network employs shared convolutions, reparameterization, and adaptive scaling. These techniques reduce complexity while maintaining performance. The experimental results on the NEU-DET and PVEL-AD datasets showed that the proposed LEIS-Net outperformed existing methods in balancing accuracy, speed, and network complexity, demonstrating its effectiveness and superiority in industrial surface defect detection.