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<p>Small-amplitude square-modulated light intensity techniques have been well known for the measurements of electron lifetime and electron diffusion time in dye-sensitized solar cells (DSSCs). The measurements are typically taken in the time domain, followed by exponential fitting of the resulting photovoltage/photocurrent decay. Alternatively, sinusoidally modulated light intensity techniques use frequency-domain measurements for the same purpose, which are traditionally known as intensity-modulated photovoltage spectroscopy (IMVS) and intensity-modulated photocurrent spectroscopy (IMPS), respectively, for the measurement of electron lifetime and electron diffusion time. In this work, we invoke the possibility of using square-modulated light intensity in the frequency domain. We show that invoking the frequency dependence of square modulation provides a viable alternative to IMVS/IMPS, with which electron time constants can be rapidly determined. We show good agreement between electron time constants obtained by our square-modulated technique and those obtained from IMVS/IMPS. A method to estimate the error associated with the technique is also presented, yielding a conservative upper bound of <InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(\Delta \tau = \tau /4\)</EquationSource> <EquationSource Format="MATHML"><math> <mrow> <mi mathvariant="normal">Δ</mi> <mi>τ</mi> <mo>=</mo> <mi>τ</mi> <mo stretchy="false">/</mo> <mn>4</mn> </mrow> </math></EquationSource> </InlineEquation> for the extracted time constants.</p>

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Small-amplitude square-modulated light intensity techniques for dye-sensitized solar cells: invoking the frequency dependence

  • 期刊论文

  • 发表日期：

    2026年6月15日

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  • Mahmoud Hezam,
  • Hamid Ghaithan,
  • Mohammad Alduraibi,
  • Ahmed Alkaoud,
  • Abdullah Aldwayyan

摘要

Small-amplitude square-modulated light intensity techniques have been well known for the measurements of electron lifetime and electron diffusion time in dye-sensitized solar cells (DSSCs). The measurements are typically taken in the time domain, followed by exponential fitting of the resulting photovoltage/photocurrent decay. Alternatively, sinusoidally modulated light intensity techniques use frequency-domain measurements for the same purpose, which are traditionally known as intensity-modulated photovoltage spectroscopy (IMVS) and intensity-modulated photocurrent spectroscopy (IMPS), respectively, for the measurement of electron lifetime and electron diffusion time. In this work, we invoke the possibility of using square-modulated light intensity in the frequency domain. We show that invoking the frequency dependence of square modulation provides a viable alternative to IMVS/IMPS, with which electron time constants can be rapidly determined. We show good agreement between electron time constants obtained by our square-modulated technique and those obtained from IMVS/IMPS. A method to estimate the error associated with the technique is also presented, yielding a conservative upper bound of \(\Delta \tau = \tau /4\) Δ τ = τ / 4 for the extracted time constants.