Intrinsic noise behavioral modeling of GaN HEMTs under small-signal conditions using WOA-HKELM
摘要
The small-signal intrinsic noise behavior of a GaN high electron mobility transistors (HEMTs) was modeled using the whale optimization algorithm-hybrid kernel extreme learning machine (WOA-HKELM) algorithm. This algorithm not only addresses the issues associated with extreme learning machine (ELM), such as the challenge of determining the number of hidden-layer nodes and the occurrence of overfitting, but also identifies the optimal regularization coefficient C and kernel parameters S that support the HKELM algorithm through the utilization of the WOA. To verify the superiority of the proposed WOA-HKELM algorithm, small-signal noise modeling experiments were conducted on GaN HEMT devices with different gate dimensions under various bias conditions. The modeling performance of WOA-HKELM was compared with that of the improved Sparrow Search Optimized Hybrid Kernel Extreme Learning Machine (MShOA-HKELM), HKELM, and other algorithms. Experimental demonstrate that the WOA-HKELM achieves higher accuracy and stability in modeling the intrinsic small-signal noise characteristics of GaN HEMTs.