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<p>Graphene samples with various numbers of layers and their relative rotation in the graphene plane were obtained by chemical vapor deposition on a copper catalyst. The properties of the obtained graphene structures were revealed by Raman spectroscopy. The position and shape of the main peaks changed depending on the number of layers and their rotation, which indicated a change in the nature of the interaction between the layers. Additional peaks were studied as a function of the twist angle of the graphene layers. Determining the distinctive characteristics of the studied twisted structures is a necessary step in optimizing the scalable synthesis and production of graphene-based nanoelectronic devices.</p>

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Raman Spectroscopy of Multilayer Graphene Structures with Various Twist Angles Between Layers

  • 期刊论文

  • 发表日期：

    2025年9月11日

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  • D. P. Borisenko,
  • N. I. Kargin,
  • M. G. Rybin

摘要

Graphene samples with various numbers of layers and their relative rotation in the graphene plane were obtained by chemical vapor deposition on a copper catalyst. The properties of the obtained graphene structures were revealed by Raman spectroscopy. The position and shape of the main peaks changed depending on the number of layers and their rotation, which indicated a change in the nature of the interaction between the layers. Additional peaks were studied as a function of the twist angle of the graphene layers. Determining the distinctive characteristics of the studied twisted structures is a necessary step in optimizing the scalable synthesis and production of graphene-based nanoelectronic devices.