Role of Excess Free Carriers in the Plasma–Elastic Photoacoustic Response of Semiconductors
摘要
We numerically and experimentally investigate the impact of photogenerated minority excess carriers on the plasma–elastic and total photoacoustic response of semiconductors. The frequency domain behavior of photoacoustic signals is examined as a function of the surface conditions, optical absorbance, and material thickness. For a visible-light excitation, distinct peak-like features in the plasma–elastic amplitude emerge at high modulation frequencies and for thin enough samples. These trends are attributed to carrier density asymmetries between the illuminated and non-illuminated surfaces. These findings highlight the key role of carrier dynamics in shaping plasma–elastic coupling to optimize and interpret photoacoustic measurements in semiconductor characterization.