Reflectivity test method of x-ray optics at the 100-m x-ray test facility

Reflectivity is a key topic in soft X-ray optics research and serves as the foundation for studying the performance of the optics for X-ray astronomical satellites. Since its establishment, the 100-m X-ray Test Facility (100XF) has been continuously developing various testing functionalities, including calibration of timing, imaging, and energy response. This paper provides a detailed description of the X-ray optics reflectivity test method based on the 100XF, which can be applied to various grazing incident X-ray optics, including Wolter-I and lobster-eye types, significantly expanding the application scope of the 100XF. A flat mirror sample (SiO \(_{\text{2 }}\) $_{\text{2}}^{}$ coated on a Si wafer) is tested. Results of the variation of reflectivity with angle @ C-K \(\alpha \) $\alpha$ (0.28 keV), Al-K \(\alpha \) $\alpha$ (1.49 keV), and Ti-K \(\alpha \) $\alpha$ (4.50 keV) are presented in the description. The reflectivity test method has also been applied to the coating reflectivity study of the enhanced X-ray Timing and Polarimetry Mission (eXTP) mirror. At the same time, a new method utilizing the continuum spectrum of bremsstrahlung was carried out to study the continuous variation of reflectivity with energy, greatly improving efficiency compared to traditional methods, and all the results show a good agreement with the theoretical values. The deviation between the test and theoretical values in the low-energy range (1.5-8.0 keV) is less than 10%.