A double sampling plan for truncated life tests under two-parameter Lindley distribution

The double sampling plan (DSP) is a generalized version of the single sampling plan (SSP) that provides several advantages, such as reduced sample size, increased discriminatory power, and better communication between producers and consumers. This study proposes a DSP for truncated life tests (TLT-DSP) using a two-parameter Lindley distribution. The proposed TLT-DSP’s parameters are determined by a mathematical model designed to minimize the average sample number while fulfilling two constraints related to predefined quality levels and tolerated risks. Performance measures of the sampling plans are investigated to evaluate and compare their efficiency and effectiveness. Our results demonstrate that the proposed DSP is more efficient than the traditional SSP, especially in cases where the lot’s quality is excellent or poor, and provides necessary protection to both parties involved. Additionally, two examples are presented, discussed and illustrated through a graphical user interface designed to validate the practicability of the proposed approach.