A fully digital temperature sensor with 187-\(\mu \text {m}^{2}\) front-end for on-chip thermal management in 55-nm CMOS
摘要
This article proposes a fully digital temperature sensor with ultra-small sensing front-end for on-chip thermal management. Utilizing the temperature characteristics of MOSFET leakage current, an innovative Leakage-Dominated inverting Schmitt-Trigger (LDST) is proposed. The ring oscillator composed of LDST achieves temperature-to-frequency conversion. Different from the traditional fixed resolution and conversion time within the full temperature range, Adaptive Resolution Frequency-to-Digital Converter (AR-FDC) is proposed to realize faster measurement speed at high temperatures to timely prevent chip overheating while maintaining high resolution at low temperatures. Fabricated with a 55 nm CMOS process, the front-end of proposed temperature sensor occupies a silicon area of just 187