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<p>Relaxor ferroelectric single-crystal materials have attracted extensive attention because of their extremely high piezoelectric and electromechanical coupling properties, but research on their mechanically induced domain switching properties under different strain rates is still lacking. In this paper, the domain switching dynamics exhibited by the PMN-0.36PT relaxor ferroelectric single crystal (with a tetragonal phase structure) under nanoindentation with variable strain rates are investigated via transmission electron microscopy in combination with the phase-field method. The microstructural material changes observed through transmission electron microscopy show that the T phase of the relaxor ferroelectric material undergoes 90° domain switching under nanoindentation. The results of a phase-field simulation involving nanoindentation with different strain rates further show that the T phase of the relaxor ferroelectric material undergoes 90° domain switching, the domain wall moves, and the original domain becomes wider directly under the indenter. Moreover, there is no correlation between the domain switching and loading rates. The phase-field simulation results are consistent with the experimental results, providing new insights into the mechanical force regulation properties of domain switching in relaxor ferroelectric materials.</p>

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Domain Switching in Relaxed Tetragonal-Phase Ferroelectric Single Crystals Under Nanoindentation

  • 期刊论文

  • 发表日期：

    2025年11月12日

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  • Guian Man,
  • Changjun Qi,
  • Yujuan Peng,
  • Jiawei Wang,
  • Yixuan Jiang,
  • Xingzhe Wang

摘要

Relaxor ferroelectric single-crystal materials have attracted extensive attention because of their extremely high piezoelectric and electromechanical coupling properties, but research on their mechanically induced domain switching properties under different strain rates is still lacking. In this paper, the domain switching dynamics exhibited by the PMN-0.36PT relaxor ferroelectric single crystal (with a tetragonal phase structure) under nanoindentation with variable strain rates are investigated via transmission electron microscopy in combination with the phase-field method. The microstructural material changes observed through transmission electron microscopy show that the T phase of the relaxor ferroelectric material undergoes 90° domain switching under nanoindentation. The results of a phase-field simulation involving nanoindentation with different strain rates further show that the T phase of the relaxor ferroelectric material undergoes 90° domain switching, the domain wall moves, and the original domain becomes wider directly under the indenter. Moreover, there is no correlation between the domain switching and loading rates. The phase-field simulation results are consistent with the experimental results, providing new insights into the mechanical force regulation properties of domain switching in relaxor ferroelectric materials.