Bending, free vibration and buckling of layered piezoelectric semiconductor nanoplates based on modified couple stress theory

This paper presents bending deformation, free vibration and buckling behaviors of three-dimensional (3D) layered piezoelectric semiconductor (PS) nanoplates with modified couple-stress effect. Analytical solutions of the extended displacements and stresses of layered PS nanoplates of bending deformation, natural frequency of free vibration and the critical buckling load under compression are derived by using the propagator matrix method. Numerical examples are provided to show the effects of the initial carrier concentration, material length scale parameter, stacking sequence of nanoplates, thickness of nanoplates, width-to-length ratio of nanoplates and loading type on the bending deformation, vibrational response, and stability of layered PS nanoplates. The results indicate that the initial carrier concentration has a significant impact on electron concentration perturbation. An increase in material length scale parameter results in enhancement of natural frequency and critical buckling load. The present results provide a new thought for the adjustment and controlling of 3D static and dynamic behaviors in the layered PS structures.