Oxygen vacancy and Schottky junction synergistically regulated Ag@SnO2 interface carrier transport performance for triethylamine gas sensing monitoring
摘要
The interface carrier transport characteristics is crucial for determining the performance of metal oxide semiconductor (MOS) gas sensors. Herein, a layered structure of Ag@SnO2 was fabricated by regulating the carrier transport characteristics at the material interface. It was found that the sample 3AgSn exhibits superior carrier transport capability (carrier density of 6.45 × 1020 cm− 3, carrier mobility of 173.16 cm2·V− 1·s− 1) compared to other samples, with the lowest interfacial charge transfer resistance (41.73 Ω). The sample named 3AgSn exhibits an ultra-high response to 50 ppm triethylamine (TEA) at an optimal operating temperature of 173 °C, which is 228 times higher than that of SnO2. Additionally, it demonstrates excellent selectivity, an ultra-low detection limit (0.067 ppm), and good long-term stability. The enhanced gas-sensing performance is mainly attributed to the synergistic regulation mechanism between oxygen vacancies and Schottky barriers. This research provides a new perspective for the design and performance enhancement of MOSs gas sensors.
Graphical abstract