A fault diagnosis method combining dual information with sample attention mechanism under small samples
摘要
The implementation of deep learning in fault diagnosis is challenging due to the small sample, since the deficiency of labeled fault data constrains the model’s efficacy. To address this challenge, a new similarity filtering-based pseudo-label learning approach (SFPL) is proposed based on dual information and sample attention mechanism. SFPL utilizes unlabeled data for pre-training through data similarity calculations. It also includes a sample attention mechanism that assigns weights to the samples to improve the efficiency of the model’s learning. Additionally, a data filtering mechanism based on cosine similarity is introduced to enhance the quality of pseudo-labels. These pseudo-labels are used to fine-tune the model for high-accuracy fault diagnosis. Validation experiments on two datasets show that the suggested method can achieve high accuracy and stability with only a few labeled samples.