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<p>The combination of quasi in situ&#xa0;experiments in a&#xa0;scanning electron microscope (SEM) with the digital image correlation (DIC) method is a&#xa0;powerful technique for investigating the characteristics of strain localizations. Additionally, techniques such as electron backscatter diffraction (EBSD) can be used to supplement the interpretation. However, DIC on SEM images presents several challenges. The greatest challenge is generating a&#xa0;suitable surface pattern that is closely related to the material under investigation and the experiment being conducted. The goal of the contrast enhancement method is to achieve a&#xa0;randomly distributed, high-contrast speckle pattern down to the submicrometer scale in order to attain both high spatial resolution and high strain resolution in the DIC calculations. Another challenge is the scanning nature of SEM images, which can exhibit complex image distortions (spatial distortion and drift).</p><p>This contribution first provides an overview of the influence of imaging parameters and various contrast techniques. It then presents a&#xa0;case study on high-resolution DIC of a&#xa0;high-strength, metastable austenitic stainless steel that was subjected to cyclic loading at room temperature (RT) in the vacuum chamber of an SEM. The high-resolution two-dimensional DIC results impressively demonstrate that martensite grains, which form during fatigue in either the tensile or compressive half-cycle, can be identified by their orientation-specific strain fields in the range of ≤ 1 µm.</p>

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Digitale Bildkorrelation mit REM-Aufnahmen – Herausforderungen und Fallbeispiel

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年7月10日

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  • Anja Weidner,
  • Horst Biermann

摘要

The combination of quasi in situ experiments in a scanning electron microscope (SEM) with the digital image correlation (DIC) method is a powerful technique for investigating the characteristics of strain localizations. Additionally, techniques such as electron backscatter diffraction (EBSD) can be used to supplement the interpretation. However, DIC on SEM images presents several challenges. The greatest challenge is generating a suitable surface pattern that is closely related to the material under investigation and the experiment being conducted. The goal of the contrast enhancement method is to achieve a randomly distributed, high-contrast speckle pattern down to the submicrometer scale in order to attain both high spatial resolution and high strain resolution in the DIC calculations. Another challenge is the scanning nature of SEM images, which can exhibit complex image distortions (spatial distortion and drift).

This contribution first provides an overview of the influence of imaging parameters and various contrast techniques. It then presents a case study on high-resolution DIC of a high-strength, metastable austenitic stainless steel that was subjected to cyclic loading at room temperature (RT) in the vacuum chamber of an SEM. The high-resolution two-dimensional DIC results impressively demonstrate that martensite grains, which form during fatigue in either the tensile or compressive half-cycle, can be identified by their orientation-specific strain fields in the range of ≤ 1 µm.