EdgeLF: edge-guided registration with loftr for visible and infrared images
摘要
The registration of visible and infrared images is a critical task in multimodal image processing. However, geometric deformations and cross-modal feature discrepancies pose significant challenges, causing traditional feature-based methods like SIFT and SuperGlue to produce registration errors, particularly under extreme illumination changes or partial occlusions. To address these issues, we propose an edge-guided registration framework based on LoFTR alignment (EdgeLF), for infrared–visible alignment, which combines edge-guided coarse alignment with local binary pattern (LBP)-based texture refinement. Experimental results show that EdgeLF achieves subpixel registration precision, delivering up to 57.1% higher accuracy than LoFTR under large-scale deformations and severe illumination variations on the RoadScene and LLVIP datasets.