Design and fabrication of single layer crescent hook metamaterial with ENZ and NZI characteristics
摘要
This work reports the design, numerical analysis, and experimental validation of a planar metamaterial structure exhibiting epsilon-near-zero (ENZ) and near-zero-index (NZI) behavior in the X-band microwave regime. The proposed unit cell is realized on a single-layer FR-4 substrate using standard PCB fabrication and operates at a resonance frequency of 9.68 GHz. Full-wave simulations performed using COMSOL Multiphysics are complemented by free-space experimental measurements conducted with a vector network analyzer and horn antenna setup in an anechoic chamber. Effective electromagnetic parameters are retrieved using the Nicolson–Ross–Weir method, confirming a near-zero crossing of the real part of permittivity and a simultaneous near-zero refractive index within the same spectral window. Parametric studies examining substrate thickness, metallization thickness, incidence angle, and geometric tuning parameters demonstrate stable resonance behavior, linear frequency tunability, and angular robustness up to 45° incidence. The consistency between simulated and measured results, along with the observed ENZ and NZI characteristics in a compact, single-layer configuration, indicates the suitability of the proposed structure for integration into microwave and wave-manipulation platforms where phase control and angular stability are required.