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<p>ErFeO<sub>3</sub> single crystal, approximately 45&#xa0;mm in length and 8&#xa0;mm in diameter, was grown using the optical floating zone method. The grown ErFeO<sub>3</sub> single crystal was cut into three different orientations along (101), (010), and (100) planes with the help of a Laue diffractometer. The phase purity of the grown crystal was confirmed using powder X-ray diffraction (XRD). Rietveld refinement analysis shows that ErFeO<sub>3</sub> possesses an orthorhombic crystal structure and belongs to the space group <i>Pbnm</i>, with lattice parameters <i>a</i> = 5.2567 Å, <i>b</i> = 5.5822 Å, and <i>c</i> = 7.5881 Å. Raman spectroscopy revealed significant changes in the intensity of Raman modes across the different orientations. The major Raman modes were simulated using DFT to find out the peak position and the atomic motions associated with it. Using Photoluminescence spectroscopy, the band gap of the oriented ErFeO₃ wafers was estimated to be 2.16&#xa0;eV. Additionally, dielectric measurements were performed on the (101), (010), and (100) oriented wafers. A discontinuity in the real part of the dielectric constant was observed around 768, 763, and 758&#xa0;K for the (101), (010), and (100) orientations, respectively. Orientation-dependent nano-indentation studies showed that the indentation hardness varied among the different orientations. The (101) orientation exhibited the highest hardness at 17.2 ± 0.3 GPa, while the (010) and (100) orientations had lower hardness values of 14.3 ± 0.4 GPa and 16.4 ± 0.5 GPa, respectively.</p>

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Structural, Dielectric, and Mechanical Properties of ErFeO3 Single Crystal Grown Using Optical Floating Zone Method

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2025年11月19日

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  • Ved Krishna,
  • R. M. Sarguna,
  • K. Ganesan,
  • R. Ramaseshan,
  • C. Kamal,
  • S. Ganesamoorthy

摘要

ErFeO3 single crystal, approximately 45 mm in length and 8 mm in diameter, was grown using the optical floating zone method. The grown ErFeO3 single crystal was cut into three different orientations along (101), (010), and (100) planes with the help of a Laue diffractometer. The phase purity of the grown crystal was confirmed using powder X-ray diffraction (XRD). Rietveld refinement analysis shows that ErFeO3 possesses an orthorhombic crystal structure and belongs to the space group Pbnm, with lattice parameters a = 5.2567 Å, b = 5.5822 Å, and c = 7.5881 Å. Raman spectroscopy revealed significant changes in the intensity of Raman modes across the different orientations. The major Raman modes were simulated using DFT to find out the peak position and the atomic motions associated with it. Using Photoluminescence spectroscopy, the band gap of the oriented ErFeO₃ wafers was estimated to be 2.16 eV. Additionally, dielectric measurements were performed on the (101), (010), and (100) oriented wafers. A discontinuity in the real part of the dielectric constant was observed around 768, 763, and 758 K for the (101), (010), and (100) orientations, respectively. Orientation-dependent nano-indentation studies showed that the indentation hardness varied among the different orientations. The (101) orientation exhibited the highest hardness at 17.2 ± 0.3 GPa, while the (010) and (100) orientations had lower hardness values of 14.3 ± 0.4 GPa and 16.4 ± 0.5 GPa, respectively.