<p>In this paper, the multiphysics field finite element (FEM) simulation model for double sided high temperature superconducting (HTS) thin film is established to carry out the influence of thin film parameters on quench characteristics. Based on the FEM simulation model, the influence mechanism of HTS thin film structure parameters (including thin film diameter, critical current density, superconducting line width, shunt layer parameter, substrate layer thickness) on quench characteristics is analyzed deeply, and the coupling sensitivity analysis is also investigated. It can be found from the simulation results that HTS thin film structure parameters have the different influence on its quench characteristics. Meanwhile, the coupling sensitivity analysis results indicate that, the mentioned thin film structure parameters need to be comprehensively considered during the double sided HTS thin film current limiter design process according to the actual current limiting requirements and operation environment. This work can offer the preliminary exploration and accumulation for the structure optimization design of double sided HTS thin film current limiter with integrating multiple current limiting capacities, to mitigate the different levels of short-circuit fault current in the future, for the important engineering application value and scientific significance.</p>