<p>In this report, a series array of YBa₂Cu₃O_7 − x step edge Josephson junctions is fabricated on SrTiO₃ substrate using photolithography and ion beam etching techniques, and their electrical transport measurements are performed. We have studied the effect of the number of junctions on the parameters of the array, such as critical current I_c and normal state resistance R_n. For this, the measurements are performed for individual junctions as well as the array of the junctions. It is found that the critical current for each junction is almost the same, which indicates that the junctions are fabricated uniformly. Moreover, the normal state resistance increases linearly with the number of junctions in the array. For a single junction at 70&#xa0;K, the R_n value is found to be ~ 5 Ω, which increases to ~ 12.5 Ω for the array of four junctions connected in series. At 70&#xa0;K, the critical current I_c for the array of junctions is ~ 490 µA, resulting in an I_cR_n product of ~ 6 mV, which is good enough for practical applications such as oscillators and high frequency detectors. The temperature dependence analysis of the critical current suggests a superconductor-normal-superconductor (SNS) type behavior of the junction.</p>