Charge transport studies on pulsed laser deposited grown manganite based thin film device

Charge transport studies on pulsed laser deposition grown Y_0.95Ca_0.05MnO₃ (YCMO) thin film on (100) single crystalline Nb:SrTiO₃ (SNTO) substrate. X-ray diffraction analysis reveals the single phase nature of YCMO manganite film having lattice mismatch between YCMO thin layer and SNTO substrate. Surface morphology, studied using atomic force microscopy, indicates the presence of island like grain growth with narrow size distribution. Transport properties have been studied by performing temperature dependent resistivity under different applied voltages across the YCMO/SNTO interface to understand the charge conduction across the same interface. The observed electric field-induced modifications in interface resistance across the YCMO/SNTO lattice have been discussed in the contexts of barrier between YCMO and SNTO, oxygen vacancies, structural disorder and structurally strained region at the film–substrate interface. Electrical resistance has been theoretically fitted using various models and mechanisms to better understand the charge conduction mechanisms in the semiconducting region for the YCMO/SNTO interface.