The effect of roughness in reverse magnetization process of [Co/Cu]2 multilayers
摘要
The effect on the magnetic properties of multilayer films is investigated by changing the roughness variation due to the thickness of the non-magnetic layer film. The increase in roughness due to the thickness of the nonmagnetic layer affects the ease with which the magnetic moments of the two layers can be reversed, which is reflected as the magnitude of the demagnetizing field in the hysteresis loop. We have investigated the interface structure and magnetic properties of [Co/Cu]2 multilayers. Anomalous hysteresis "steps" were observed during the demagnetization process, and the reverse magnetic field became larger with the thickness of the nonmagnetic layer. Time-of-flight polarized neutron reflectometry and atomic force microscope are used as structural probes to explore the interface roughness and surface roughness in [Co/Cu]2 multilayers, respectively. The law of increasing surface roughness with thickness is verified. It will help to achieve material modification and artificial adjustment of the demagnetization process through a relatively easy preparation method for the development of complex devices. Moreover, the preparation of the hundred nanometer thickness films by sputtering technology is advantageous, which can be used in large quantities for industrial production.