Shewhart-type location control chart based on capability indices \({{\varvec{C}}}{\varvec{p}}\) and \({{\varvec{C}}}{\varvec{p}}{\varvec{k}}\) applied to profile monitoring
摘要
Statistical control charts are essential tools for monitoring and controlling processes. They help to interpret their stability and detect deviations when the process is out of statistical control due to special causes. However, this sensitivity can be a disadvantage when we have processes that have high capacity, and some slack can be allowed. In this case, the control charts need to be “desensitized” to detect small changes that have no practical significance. The increasing availability of data has made profile monitoring an emerging area of research. The location control chart is a prominent alternative due to its applicability and simplicity. It maintains all information about the data observed in each location where the profile needs to be evaluated. This article discusses the importance of adjusting location control charts based on