<p>In industrial settings, 3D scanners have gained popularity for verifying dimensional conformity of manufactured parts. They offer an optimal balance between rapid data acquisition and high-quality measurements, making them particularly well-suited for inspecting mechanical components. However, scan path generation methods, regardless of the displacement system, remain a key challenge in achieving complete surface coverage with the desired scan quality in minimal time. In the literature, the proposed scan paths are generally validated by their executions on a physical system. This paper presents the development of a scanning simulator specifically designed for laser-plane scanners. Based on visibility and quality criteria, this simulator makes it possible to define the correctly digitized areas of the part. The simulator enables the validation of scan paths prior to physical digitization, supporting the creation of optimized and efficient scanning trajectories.</p>

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Assessment of scan path for surface inspection via CAD- based simulation

  • Nguyen Duy Minh Phan,
  • Yann Quinsat

摘要

In industrial settings, 3D scanners have gained popularity for verifying dimensional conformity of manufactured parts. They offer an optimal balance between rapid data acquisition and high-quality measurements, making them particularly well-suited for inspecting mechanical components. However, scan path generation methods, regardless of the displacement system, remain a key challenge in achieving complete surface coverage with the desired scan quality in minimal time. In the literature, the proposed scan paths are generally validated by their executions on a physical system. This paper presents the development of a scanning simulator specifically designed for laser-plane scanners. Based on visibility and quality criteria, this simulator makes it possible to define the correctly digitized areas of the part. The simulator enables the validation of scan paths prior to physical digitization, supporting the creation of optimized and efficient scanning trajectories.