Analog Circuit Fault Diagnosis Based on Gramian Angular Field and Multi-Scale Dual Attention Residual Shrinkage Network
摘要
Analog circuit soft fault diagnosis remains crucial for system reliability but is hindered by weak fault signatures and significant noise interference. This study introduces a novel framework that converts one-dimensional circuit signals into two-dimensional Gramian Angular Field (GAF) images, recasting the diagnosis as an image classification task. The core of the method is a Multi-scale Deep Residual Shrinkage Network (MS-DARSN), which leverages an integrated dual-attention mechanism to adaptively suppress noise and refine discriminative features. Evaluated on a four-op-amp high-pass filter and a Sallen-Key band-pass filter, the proposed GAF-MS-DARSN model achieved high accuracies of 99.87% and 99.81%, respectively, surpassing benchmark methods in precision and F1-score. Robustness evaluation via five-fold cross-validation under 10 dB noise conditions demonstrates that the model maintains an accuracy of 95.47%, reflecting its strong generalization capability and practical potential.