Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors

This paper presents a two-step single-slope (TS-SS) analog-to-digital converter (ADC) for CMOS image sensors (CIS). The proposed TS-SS ADC divides the pixel signal into small and large signal regions using a precomparator. When quantizing large pixel signals, the TS-SS ADC enters accelerated mode, which leverages the differential topology of the ramp generator to speed up quantization. The accelerated mode reduces the row cycle, resulting in a 31.3% reduction at 320 MHz clock from 27.3 to 18.75 µs. The designed 12-bit TS-SS ADC was designed in a 110 nm 1P4M CMOS technology, and its linearity was verified by process corner post-simulation and Monte Carlo simulation.