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<p>We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.</p>

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Precision tests of third-generation four-quark operators: one- and two-loop matching

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2025年2月7日

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  • Ulrich Haisch,
  • Luc Schnell

摘要

We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.